Christoph Neururer

 +41 26 300 8925

  • Scanning Electron Microscopy (SEM), Energie Dispersive X-Ray Micro Spectrometrie (EDS), Electron   Backscattered Diffraction (EBSD), Cathodoluminescence (CL), automated Particle Analysis and sample preparation for SEM.
  • Focussed Ion Beam (FIB)
  • x-ray Micro Computer Tomography (Micro CT)
  • 3D image analysis with Avizo software
  • x-ray Fluorescence Spectroscopy (XRF)
  • x-ray Powder Diffraction (XRD)
  • Prototype engineering for research


Technical Officer
Department of Geosciences

PER 07 bu. 3.311
Ch. du Musée 6
1700 Fribourg
Friday: morning and afternoon
PER 07, 3.311

Teaching and courses

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