Atomic force microscopy
Park N10
Acquired 2016
The Park Systems NX10 Atomic Force Microscope (AFM) enables high-resolution nanoscale surface characterization of both inorganic materials and organic samples, providing topographical, mechanical, and electrical insights
Show Technical description
Brand
Park systems NX10 AFM
Imaging modes
- Contact mode
- Tapping mode
- True non-contact mode (recommended for soft samples and minimal tip wear)
- Many other modes are available to measure electrical, mechanical, magnetic, thermal properties, and forces.
System features
- Enclosed in an acoustic hood and vibration isolation table.
- Independent XY scanner for sample positioning, decoupled from the Z scanner feedback loop, improving accuracy in nano resolution.
- XY scan range: 50 µm × 50 µm
- Z scan range: 15 µm
- Sample size: recommended ≤50 × 50 mm, max thickness 20 mm
- Motorized XY stage (20 mm × 20 mm, 0.6 µm steps) and motorized Z stage (25 mm travel, 0.08 µm steps)
- Magnetic sample holder
- Currently used only for imaging dry samples