• Neels Antonia

• Neels Antonia

This course handles the crystalline state of matter, the underlying rules and focusses on the basics and application of X-ray based analytical techniques. Diffraction and scattering methods are widely used to investigate the crystallography and microstructural properties of materials. The knowledge of structure presents the basis for the understanding of macroscopic physical behavior and the functioning of materials and materials systems. This course introduces the fundamentals of crystallography, the basics theoretical aspects of diffraction and diffraction methods and their use in modern applications.

The students will know how materials and materials systems are characterized by crystallographic methods. An introduction to fundamentals of Crystallography (symmetry of crystals) and basic theoretical aspects of X-ray diffraction (Generation of X-rays, interaction with matter, diffraction) will be given. Basic experimental aspects will be taught for single crystal, powder and thin film X-ray diffraction aiming at providing a solid knowledge on a large spectrum of methods relevant to diffraction studies on materials. The students will be familiarized with modern X-ray diffractometers, instrumental optics, novel X-ray detection systems and experiment strategies for solving complex analytical problems relevant for today's research and in tackling questions with respect to industrial applications. In addition to crystalline materials (e.g. inorganic materials, MOFs), also short-range ordering in partially crystalline (polymers, nanoparticle systems) and amorphous systems (glasses) will be discussed.

Given as block course as indicated at the beginning of the semester.

Written exam in physical presence 60 min 

Exam is OPEN BOOK

Allowed support: notes / books, calculator (needed !)

Début de toutes les épreuves à 8h00 précises.

1 épreuve CH.4705 = 1 heure

2 épreuves CH.4705 et CH.4706 = 2 heures