Lecturer, PhD Assistant
PER 08 - 0.52
+41 26 300 9169
Scanning tunneling microscopy and spectroscopy (STM/STS)
This measurement method allows to characterize the topographic as well as the electronic properties of the surface of (semi)-conducting crystals up to atomic resolution.
The setup needs perfectly clean and flat surfaces. It works in ultra-high vacuum (10-11 mbar) and cryogenic conditions (4.5 K).