- Scanning Electron Microscopy (SEM), Energie Dispersive X-Ray Micro Spectrometrie (EDS), Electron Backscattered Diffraction (EBSD), Cathodoluminescence (CL), automated Particle Analysis and sample preparation for SEM.
- Focussed Ion Beam (FIB)
- x-ray Micro Computer Tomography (Micro CT)
- 3D image analysis with Avizo software
- x-ray Fluorescence Spectroscopy (XRF)
- x-ray Powder Diffraction (XRD)
- Prototype engineering for research