Administrators

• Scanning electron microscopy
  

  Dimitri Vanhecke

  Research Associate, Research Associate SNSF

  PER 18 - B127
  +41 26 300 9509
  E-mail

• Transmission electron microscopy
  

  Dimitri Vanhecke

  Research Associate, Research Associate SNSF

  PER 18 - B127
  +41 26 300 9509
  E-mail

  

  Jorge Larios

  Laboratory Technician

  
  +41 26 300 9067
  E-mail

• Focused ion beam scanning electron microscopy
  

  Dimitri Vanhecke

  Research Associate, Research Associate SNSF

  PER 18 - B127
  +41 26 300 9509
  E-mail

• Conventional TEM Sample preparation
  

  Jorge Larios

  Laboratory Technician

  
  +41 26 300 9067
  E-mail

• CryoTEM sample preparation
  

  Dimitri Vanhecke

  Research Associate, Research Associate SNSF

  PER 18 - B127
  +41 26 300 9509
  E-mail

• Confocal laser scanning microscopy
  

  Dimitri Vanhecke

  Research Associate, Research Associate SNSF

  PER 18 - B127
  +41 26 300 9509
  E-mail

• Darkfield scattering microscope
  

  Dimitri Vanhecke

  Research Associate, Research Associate SNSF

  PER 18 - B127
  +41 26 300 9509
  E-mail

• Fluorescence microscopy
  

  Dimitri Vanhecke

  Research Associate, Research Associate SNSF

  PER 18 - B127
  +41 26 300 9509
  E-mail

• Atomic force microscopy
  

  Jorge Larios

  Laboratory Technician

  
  +41 26 300 9067
  E-mail

• Small Angle X-ray Scattering
  

  Sándor Balog

  Research Associate, Research Associate SNSF

  PER 18 - B128
  +41 26 300 8964
  E-mail

• Dynamic light scattering
  

  Sándor Balog

  Research Associate, Research Associate SNSF

  PER 18 - B128
  +41 26 300 8964
  E-mail