X-ray Laboratory

Equipment: X-ray diffractometer Philips PW1800
Purpose: Mineralogical analysis, phase identi-fication, peak fitting, Rietveld analysis

Equipment: High-temperature X-ray diffracto-meter Philips PW1830
Purpose: X-ray diffraction at high temperature (up to 1400°C), controlled atmosphere
Responsible person: B. Grobéty

Equipment: X-ray fluorescence spectrometer Philips PW2400
Purpose : Bulk analyses of (silicate) rock samples, main and trace elements - ppm level
Responsible person: V. Serneels, Ch. Neururer,
P. Dietsche