Scanning electron microscopy

Equipment: FEI XL30 Sirion FEG with Secondary Electron, Backscatter Electron and Cathodoluminescence detector, OIM Electron Backscatter Diffraction system, EDAX Energy Dispersive Spectrometer.

Responsible person: B. Grobéty, C. Neururer

Introduction course (ppt 3.5mb)
System description (pdf 68kb)

Examples
Morphology
EDS
EBSD